Simulating the electron beam induced current (EBIC) effect in a computer
Electron-Beam-Induced Current (EBIC) is a technique that makes use of the induced current generated as the result of the electron beam bombardment upon the specimen for semiconductor materials and devices characterisation. Material characterisation is one of the important fields i...
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| Formato: | Final Year Project (FYP) |
| Idioma: | English |
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2012
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| Acesso em linha: | http://hdl.handle.net/10356/49296 |