Atomistic simulation of structure and mobility of dislocation in semiconductor

The core structure and mobility of 90° partial dislocations have been studied. The core structure were simulated and analysed for 0K and at elevated temperature.

Bibliographic Details
Main Author: Choo, Zhi Min.
Other Authors: Liang, Meng Heng
Format: Thesis
Language:English
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/5045

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