New control charts for monitoring frequency and magnitude of critical events
Quality is an extremely important feature for satisfying customers and winning market shares nowadays. When a quality problem occurs, it is crucial to detect it quickly in order to avoid serious consequence and economic loss. A very effective method in Statistical Process Control (SPC) is control ch...
Main Author: | Qu, Liang. |
---|---|
Other Authors: | School of Mechanical and Aerospace Engineering |
Format: | Thesis |
Language: | English |
Published: |
2013
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/51341 |
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