New control charts for monitoring frequency and magnitude of critical events

Quality is an extremely important feature for satisfying customers and winning market shares nowadays. When a quality problem occurs, it is crucial to detect it quickly in order to avoid serious consequence and economic loss. A very effective method in Statistical Process Control (SPC) is control ch...

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Bibliographic Details
Main Author: Qu, Liang.
Other Authors: School of Mechanical and Aerospace Engineering
Format: Thesis
Language:English
Published: 2013
Subjects:
Online Access:http://hdl.handle.net/10356/51341

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