Development of data acquisition system to compute metal electron work function
Scanning Kelvin Probe (SKP) microscopy is a technique commonly used to achieve the contact potential difference (CPD) between two surfaces – the sample and the probe. During measurements, a SKP was used to get the voltage and current values of a sample from its work station. In this project, a Graph...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2013
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| Online Access: | http://hdl.handle.net/10356/53347 |