Development of sharp and high aspect ratio atomic force microscope probe tip

Development of sharp and high aspect ratio atomic force microscope probe tip

This project designed AFM probe tips to minimise errors, along with methods of micromachining them.

Bibliographic Details
Main Author:	Lim, Boon Hong.
Other Authors:	Ngoi, Bryan Kok Ann
Format:	Thesis
Published:	2008
Subjects:	DRNTU::Engineering::Manufacturing::Metrology
Online Access:	http://hdl.handle.net/10356/5998

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