Investigation of micro-EDM controllable factors on machined silicon surface quality
The present study examines the effect of interaction of micro-EDM controllable factors such as discharge-energy, traverse speed and feed rate on the surface integrity with p-type boron-doped silicon. The average surface roughness is quantitatively correlated to input discharge-energy. Further an emp...
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/6175 |
| _version_ | 1811688757843197952 |
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| author | Nachiappan Ravi |
| author2 | Yeo, Swee Hock |
| author_facet | Yeo, Swee Hock Nachiappan Ravi |
| author_sort | Nachiappan Ravi |
| collection | NTU |
| description | The present study examines the effect of interaction of micro-EDM controllable factors such as discharge-energy, traverse speed and feed rate on the surface integrity with p-type boron-doped silicon. The average surface roughness is quantitatively correlated to input discharge-energy. Further an empirical relationship was computed between the average surface roughness and area fraction of voids. Next, a DOE (Design of Experiment) technique is adopted to describe specifically the interaction effect of the input controllable factors such as traverse speed and feed rate on the average surface roughness. Subsequently, a second order polynomial model that can adequately describe the relationship between the same is found. |
| first_indexed | 2024-10-01T05:37:17Z |
| format | Thesis |
| id | ntu-10356/6175 |
| institution | Nanyang Technological University |
| last_indexed | 2024-10-01T05:37:17Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/61752023-03-11T16:54:17Z Investigation of micro-EDM controllable factors on machined silicon surface quality Nachiappan Ravi Yeo, Swee Hock School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing::Product engineering The present study examines the effect of interaction of micro-EDM controllable factors such as discharge-energy, traverse speed and feed rate on the surface integrity with p-type boron-doped silicon. The average surface roughness is quantitatively correlated to input discharge-energy. Further an empirical relationship was computed between the average surface roughness and area fraction of voids. Next, a DOE (Design of Experiment) technique is adopted to describe specifically the interaction effect of the input controllable factors such as traverse speed and feed rate on the average surface roughness. Subsequently, a second order polynomial model that can adequately describe the relationship between the same is found. Master of Engineering (MPE) 2008-09-17T11:08:36Z 2008-09-17T11:08:36Z 2000 2000 Thesis http://hdl.handle.net/10356/6175 Nanyang Technological University application/pdf |
| spellingShingle | DRNTU::Engineering::Manufacturing::Product engineering Nachiappan Ravi Investigation of micro-EDM controllable factors on machined silicon surface quality |
| title | Investigation of micro-EDM controllable factors on machined silicon surface quality |
| title_full | Investigation of micro-EDM controllable factors on machined silicon surface quality |
| title_fullStr | Investigation of micro-EDM controllable factors on machined silicon surface quality |
| title_full_unstemmed | Investigation of micro-EDM controllable factors on machined silicon surface quality |
| title_short | Investigation of micro-EDM controllable factors on machined silicon surface quality |
| title_sort | investigation of micro edm controllable factors on machined silicon surface quality |
| topic | DRNTU::Engineering::Manufacturing::Product engineering |
| url | http://hdl.handle.net/10356/6175 |
| work_keys_str_mv | AT nachiappanravi investigationofmicroedmcontrollablefactorsonmachinedsiliconsurfacequality |