Development and application of a moire interferometric strain sensor
Moire Interferometry is a whole field, high sensitive technique for deformation measurement. It is a good experimental technique that has a combination of high sensitivity, optical contrast, range and spatial resolution. This experimental technique relies on interference of high frequency deformable...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Published: |
2008
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/6226 |
| _version_ | 1826115971782279168 |
|---|---|
| author | Oh, Kim Eng |
| author2 | Chai, Gin Boay |
| author_facet | Chai, Gin Boay Oh, Kim Eng |
| author_sort | Oh, Kim Eng |
| collection | NTU |
| description | Moire Interferometry is a whole field, high sensitive technique for deformation measurement. It is a good experimental technique that has a combination of high sensitivity, optical contrast, range and spatial resolution. This experimental technique relies on interference of high frequency deformable specimen grating with a fixed reference grating to obtain contours of in-plane displacement components with sub-micron sensitivity. In this project, a moire interferometric strain sensor is designed and developed to improve the shortcomings and limitations of the commercial available moire interferometer, which is unable to resolve very small and localized vicinity. |
| first_indexed | 2024-10-01T04:03:48Z |
| format | Thesis |
| id | ntu-10356/6226 |
| institution | Nanyang Technological University |
| last_indexed | 2024-10-01T04:03:48Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/62262023-03-11T16:55:36Z Development and application of a moire interferometric strain sensor Oh, Kim Eng Chai, Gin Boay School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing::Metrology Moire Interferometry is a whole field, high sensitive technique for deformation measurement. It is a good experimental technique that has a combination of high sensitivity, optical contrast, range and spatial resolution. This experimental technique relies on interference of high frequency deformable specimen grating with a fixed reference grating to obtain contours of in-plane displacement components with sub-micron sensitivity. In this project, a moire interferometric strain sensor is designed and developed to improve the shortcomings and limitations of the commercial available moire interferometer, which is unable to resolve very small and localized vicinity. Master of Engineering (MPE) 2008-09-17T11:09:44Z 2008-09-17T11:09:44Z 2000 2000 Thesis http://hdl.handle.net/10356/6226 Nanyang Technological University application/pdf |
| spellingShingle | DRNTU::Engineering::Manufacturing::Metrology Oh, Kim Eng Development and application of a moire interferometric strain sensor |
| title | Development and application of a moire interferometric strain sensor |
| title_full | Development and application of a moire interferometric strain sensor |
| title_fullStr | Development and application of a moire interferometric strain sensor |
| title_full_unstemmed | Development and application of a moire interferometric strain sensor |
| title_short | Development and application of a moire interferometric strain sensor |
| title_sort | development and application of a moire interferometric strain sensor |
| topic | DRNTU::Engineering::Manufacturing::Metrology |
| url | http://hdl.handle.net/10356/6226 |
| work_keys_str_mv | AT ohkimeng developmentandapplicationofamoireinterferometricstrainsensor |