Design for reliability through engineering optimization
The pursuit of Moore’s Law, in term of improving transistor performance, simply by reducing transistor geometry (e.g. oxide thickness reduction, gate length reduction etc.) has come under technical challenge of meeting the performance requirement since the 130nm technology node. (e.g. copper interco...
| Үндсэн зохиолч: | |
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| Бусад зохиолчид: | |
| Формат: | Дипломын ажил |
| Хэл сонгох: | English |
| Хэвлэсэн: |
2015
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| Нөхцлүүд: | |
| Онлайн хандалт: | http://hdl.handle.net/10356/63945 |