New product test development
Silicon Labs is a leading provider of silicon, software and system solutions for the Internet of Things, Internet infrastructure, industrial control, consumer and automotive markets. Its portfolio of mixed-signal integrated circuits (ICs) includes microcontrollers (MCUs), sensors, wireless ICs, timi...
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| Natura: | Final Year Project (FYP) |
| Lingua: | English |
| Pubblicazione: |
2015
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| Accesso online: | http://hdl.handle.net/10356/64176 |
| _version_ | 1826112632545869824 |
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| author | Chew, Teow Kim |
| author2 | Amanda Fu |
| author_facet | Amanda Fu Chew, Teow Kim |
| author_sort | Chew, Teow Kim |
| collection | NTU |
| description | Silicon Labs is a leading provider of silicon, software and system solutions for the Internet of Things, Internet infrastructure, industrial control, consumer and automotive markets. Its portfolio of mixed-signal integrated circuits (ICs) includes microcontrollers (MCUs), sensors, wireless ICs, timing devices, digital isolators and broadcast audio and video products. Due to unavoidable statistical flaws in the materials and masks used to fabricate ICs, there is no doubt that 100% yield on any particular IC is impossible. It is in the chip manufacturer’s best interest to minimize the number of bad devices shipped to the customer, thus the need for IC testing for quality assurance. This project will focus on studying of the GT7 test development manual, the C8051Fxxx small MCU devices and convert the existing 8 bit GT6 Platform testing software to the upgraded 32 bit GT7S Platform testing software, to test on its analog peripherals. Small form factor microcontrollers are MCUs available in tiny packages (down to 2 x 2 mm) with no compromise in performance or integration. The C8051Fxxx small MCU devices are available in 24-pin, 28pin and 32-pin packages and include 16 kB flash with 10-bit ADC. At the end of the project, a golden ratio correlation test will be conducted between the MCUs tested on the GT7S testing platform and on the GT6 testing platform. This test ensures that data obtained from the new testing platform can repeat values obtained from the old testing platform, thus proving its reliability. |
| first_indexed | 2024-10-01T03:10:17Z |
| format | Final Year Project (FYP) |
| id | ntu-10356/64176 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T03:10:17Z |
| publishDate | 2015 |
| record_format | dspace |
| spelling | ntu-10356/641762023-07-07T15:48:05Z New product test development Chew, Teow Kim Amanda Fu Shen Wei Ong Keng Sian, Vincent School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Silicon Labs is a leading provider of silicon, software and system solutions for the Internet of Things, Internet infrastructure, industrial control, consumer and automotive markets. Its portfolio of mixed-signal integrated circuits (ICs) includes microcontrollers (MCUs), sensors, wireless ICs, timing devices, digital isolators and broadcast audio and video products. Due to unavoidable statistical flaws in the materials and masks used to fabricate ICs, there is no doubt that 100% yield on any particular IC is impossible. It is in the chip manufacturer’s best interest to minimize the number of bad devices shipped to the customer, thus the need for IC testing for quality assurance. This project will focus on studying of the GT7 test development manual, the C8051Fxxx small MCU devices and convert the existing 8 bit GT6 Platform testing software to the upgraded 32 bit GT7S Platform testing software, to test on its analog peripherals. Small form factor microcontrollers are MCUs available in tiny packages (down to 2 x 2 mm) with no compromise in performance or integration. The C8051Fxxx small MCU devices are available in 24-pin, 28pin and 32-pin packages and include 16 kB flash with 10-bit ADC. At the end of the project, a golden ratio correlation test will be conducted between the MCUs tested on the GT7S testing platform and on the GT6 testing platform. This test ensures that data obtained from the new testing platform can repeat values obtained from the old testing platform, thus proving its reliability. Bachelor of Engineering 2015-05-25T04:52:11Z 2015-05-25T04:52:11Z 2015 2015 Final Year Project (FYP) http://hdl.handle.net/10356/64176 en Nanyang Technological University 32 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Chew, Teow Kim New product test development |
| title | New product test development |
| title_full | New product test development |
| title_fullStr | New product test development |
| title_full_unstemmed | New product test development |
| title_short | New product test development |
| title_sort | new product test development |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits |
| url | http://hdl.handle.net/10356/64176 |
| work_keys_str_mv | AT chewteowkim newproducttestdevelopment |