Magnetoresistance metrology of skyrmion hosting multilayer thin films

In this magnetoresistance metrology study, the main goal is to establish the detection of room temperature skyrmions at low current, so that skyrmions stays fixed, with an effectively and reliable method. In addition to it, is the identification of the critical current that will allow skyrmions moti...

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Main Author: Lew, Lincoln Wai Cheong
Other Authors: Christos Panagopoulos
Format: Final Year Project (FYP)
Language:English
Published: 2017
Subjects:
Online Access:http://hdl.handle.net/10356/71934
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author Lew, Lincoln Wai Cheong
author2 Christos Panagopoulos
author_facet Christos Panagopoulos
Lew, Lincoln Wai Cheong
author_sort Lew, Lincoln Wai Cheong
collection NTU
description In this magnetoresistance metrology study, the main goal is to establish the detection of room temperature skyrmions at low current, so that skyrmions stays fixed, with an effectively and reliable method. In addition to it, is the identification of the critical current that will allow skyrmions motion via electrical pulsing. These are the crucial steps that we are undertaking to allow us to conduct dynamic detection of skyrmions, which in this case skyrmions are moving. The key findings of this study have been exciting because it has shown the reproducibility of skyrmions detection in both thin films and Hall bars. Furthermore, the transport measurement proves to be a success even in the unprecedented measurement of other different material composition, having a metal oxide layer. Lastly, we have successfully identified the minimum current required to allow observable skyrmion motion. These key findings are crucial as they allow us to establish towards the next research goal of electrical detection of moving skyrmions.
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spelling ntu-10356/719342023-02-28T23:12:26Z Magnetoresistance metrology of skyrmion hosting multilayer thin films Lew, Lincoln Wai Cheong Christos Panagopoulos School of Physical and Mathematical Sciences Agency for Science, Technology and Research (A*STAR) DRNTU::Science::Physics::Electricity and magnetism In this magnetoresistance metrology study, the main goal is to establish the detection of room temperature skyrmions at low current, so that skyrmions stays fixed, with an effectively and reliable method. In addition to it, is the identification of the critical current that will allow skyrmions motion via electrical pulsing. These are the crucial steps that we are undertaking to allow us to conduct dynamic detection of skyrmions, which in this case skyrmions are moving. The key findings of this study have been exciting because it has shown the reproducibility of skyrmions detection in both thin films and Hall bars. Furthermore, the transport measurement proves to be a success even in the unprecedented measurement of other different material composition, having a metal oxide layer. Lastly, we have successfully identified the minimum current required to allow observable skyrmion motion. These key findings are crucial as they allow us to establish towards the next research goal of electrical detection of moving skyrmions. Bachelor of Science in Physics 2017-05-22T09:13:33Z 2017-05-22T09:13:33Z 2017 Final Year Project (FYP) http://hdl.handle.net/10356/71934 en 79 p. application/pdf
spellingShingle DRNTU::Science::Physics::Electricity and magnetism
Lew, Lincoln Wai Cheong
Magnetoresistance metrology of skyrmion hosting multilayer thin films
title Magnetoresistance metrology of skyrmion hosting multilayer thin films
title_full Magnetoresistance metrology of skyrmion hosting multilayer thin films
title_fullStr Magnetoresistance metrology of skyrmion hosting multilayer thin films
title_full_unstemmed Magnetoresistance metrology of skyrmion hosting multilayer thin films
title_short Magnetoresistance metrology of skyrmion hosting multilayer thin films
title_sort magnetoresistance metrology of skyrmion hosting multilayer thin films
topic DRNTU::Science::Physics::Electricity and magnetism
url http://hdl.handle.net/10356/71934
work_keys_str_mv AT lewlincolnwaicheong magnetoresistancemetrologyofskyrmionhostingmultilayerthinfilms