Security analysis on memory ICs
Static Random-Access Memory (SRAM) has been widely applied in electronic devices to generate and store sensitive information such as secret key and password for hardware security applications. The SRAM is believed to be more secure than any other storage devices because of its volatile properties wh...
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| Other Authors: | |
| Format: | Final Year Project (FYP) |
| Language: | English |
| Published: |
2018
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| Online Access: | http://hdl.handle.net/10356/75184 |
| _version_ | 1826115789129777152 |
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| author | Chai, Yih Xi |
| author2 | Gwee Bah Hwee |
| author_facet | Gwee Bah Hwee Chai, Yih Xi |
| author_sort | Chai, Yih Xi |
| collection | NTU |
| description | Static Random-Access Memory (SRAM) has been widely applied in electronic devices to generate and store sensitive information such as secret key and password for hardware security applications. The SRAM is believed to be more secure than any other storage devices because of its volatile properties where the stored information will be lost when the SRAM is powered-off. However, data imprinting effect has been proven by many researchers using different approaches that the data was retained in the memory cells even after turned-off for a long period. This effect is considered as one of the major security concerns where the sensitive data could be recovered by attackers. An experiment was implemented by storing an 8-bits grayscale image into the 3 commercial SRAM chips from different manufacturers, i.e. Amic, Lyontek, Cypress, followed by stressing it in high voltage and high temperature environment for 40 hours. The vulnerability of the SRAM chips is evaluated by comparing the initial power-on data and the final power-on data after 40 stressing hours. Based on the measurement results, the original image cannot be recovered for all 3 SRAM chips. However, a positive trend is observed in Amic’s SRAM chip where more information could be possibly revealed with longer stressing hours. |
| first_indexed | 2024-10-01T04:00:55Z |
| format | Final Year Project (FYP) |
| id | ntu-10356/75184 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T04:00:55Z |
| publishDate | 2018 |
| record_format | dspace |
| spelling | ntu-10356/751842023-07-07T17:42:39Z Security analysis on memory ICs Chai, Yih Xi Gwee Bah Hwee School of Electrical and Electronic Engineering Ho Weng Geng DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Static Random-Access Memory (SRAM) has been widely applied in electronic devices to generate and store sensitive information such as secret key and password for hardware security applications. The SRAM is believed to be more secure than any other storage devices because of its volatile properties where the stored information will be lost when the SRAM is powered-off. However, data imprinting effect has been proven by many researchers using different approaches that the data was retained in the memory cells even after turned-off for a long period. This effect is considered as one of the major security concerns where the sensitive data could be recovered by attackers. An experiment was implemented by storing an 8-bits grayscale image into the 3 commercial SRAM chips from different manufacturers, i.e. Amic, Lyontek, Cypress, followed by stressing it in high voltage and high temperature environment for 40 hours. The vulnerability of the SRAM chips is evaluated by comparing the initial power-on data and the final power-on data after 40 stressing hours. Based on the measurement results, the original image cannot be recovered for all 3 SRAM chips. However, a positive trend is observed in Amic’s SRAM chip where more information could be possibly revealed with longer stressing hours. Bachelor of Engineering 2018-05-30T01:26:26Z 2018-05-30T01:26:26Z 2018 Final Year Project (FYP) http://hdl.handle.net/10356/75184 en Nanyang Technological University 51 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Chai, Yih Xi Security analysis on memory ICs |
| title | Security analysis on memory ICs |
| title_full | Security analysis on memory ICs |
| title_fullStr | Security analysis on memory ICs |
| title_full_unstemmed | Security analysis on memory ICs |
| title_short | Security analysis on memory ICs |
| title_sort | security analysis on memory ics |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits |
| url | http://hdl.handle.net/10356/75184 |
| work_keys_str_mv | AT chaiyihxi securityanalysisonmemoryics |