Thermal characterisation and analysis of GaN power devices
The main objective of this final year project is to do thermal analysis of the high-voltage AlGaN/GaN high-electron-mobility transistors (HEMTs) on Silicon (Si), Silicon Carbide (SiC) and CVD-Diamond (Dia) substrate. The measurements in this project were all done on fabricated 0.25 µm gate CPW GaN H...
Päätekijä: | Wirna |
---|---|
Muut tekijät: | Ng Geok Ing |
Aineistotyyppi: | Final Year Project (FYP) |
Kieli: | English |
Julkaistu: |
2018
|
Aiheet: | |
Linkit: | http://hdl.handle.net/10356/76291 |
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