Thermal characterisation and analysis of GaN power devices

The main objective of this final year project is to do thermal analysis of the high-voltage AlGaN/GaN high-electron-mobility transistors (HEMTs) on Silicon (Si), Silicon Carbide (SiC) and CVD-Diamond (Dia) substrate. The measurements in this project were all done on fabricated 0.25 µm gate CPW GaN H...

Täydet tiedot

Bibliografiset tiedot
Päätekijä: Wirna
Muut tekijät: Ng Geok Ing
Aineistotyyppi: Final Year Project (FYP)
Kieli:English
Julkaistu: 2018
Aiheet:
Linkit:http://hdl.handle.net/10356/76291

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