Scan implementation and toggle coverage estimation for voice subsystem
With shrinking technology node, the reliability and testability of integrated circuits has become crucial. Larger designs pose greater challenges to various aspects of Chip design including Design for Testability (DFT). DFT techniques are implemented to provide controllability and observability of t...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
2019
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/76780 |