Computer vision for advanced electron microscopy analysis
Transmission electron microscopy (TEM) is one of the most powerful techniques used to characterize materials. However, characterization of a set of heterogenous sample images still remains as a persistent challenge. This can be a painstaking process in which researches may spend a tremendous amount...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2019
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| Online Access: | http://hdl.handle.net/10356/77390 |