Ultra-low voltage SRAM design

The requirement for smaller, lighter yet increasingly powerful electronic devices has never been greater. Miniaturisation of semiconductor technology is pushing Moore’s Law to its limit, and transistor densities are higher than ever before. Power consumption is hence becoming a significant issue, es...

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Bibliographic Details
Main Author: Wong, Timothy Ting Hin
Other Authors: Kim Tae Hyoung
Format: Final Year Project (FYP)
Language:English
Published: 2019
Subjects:
Online Access:http://hdl.handle.net/10356/77830
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author Wong, Timothy Ting Hin
author2 Kim Tae Hyoung
author_facet Kim Tae Hyoung
Wong, Timothy Ting Hin
author_sort Wong, Timothy Ting Hin
collection NTU
description The requirement for smaller, lighter yet increasingly powerful electronic devices has never been greater. Miniaturisation of semiconductor technology is pushing Moore’s Law to its limit, and transistor densities are higher than ever before. Power consumption is hence becoming a significant issue, especially noticeable in integrated circuits such as Static Random-Access memory (SRAM) which can occupy over 60% of die area. Hence, the present study uses Cadence Virtuoso ADE to analyse commonly utilised 4T, 6T and 8T SRAM bit-cell topologies, and quantifies the effect of voltage scaling to sub-threshold levels, process variation and temperature variance on the static noise margins (SNMs), leakage currents and read/write energies. Furthermore, a 4-kb 256 × 16 SRAM module is implemented with 6T cells and shown to operate at 400 mV. It is found that Ultra-Low Voltage (ULV) operation of SRAM can offer over 90% decrease in active power consumption, and upwards of 95% reduction in leakage with a reduction from 1.5 V to 400 mV – albeit at a trade-off with stability margins. Operation at higher temperatures have also demonstrated up to 85% increase of leakage power for an increase of 80 C from ambient.
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spelling ntu-10356/778302023-07-07T16:31:04Z Ultra-low voltage SRAM design Wong, Timothy Ting Hin Kim Tae Hyoung School of Electrical and Electronic Engineering Centre for Integrated Circuits and Systems DRNTU::Engineering::Electrical and electronic engineering The requirement for smaller, lighter yet increasingly powerful electronic devices has never been greater. Miniaturisation of semiconductor technology is pushing Moore’s Law to its limit, and transistor densities are higher than ever before. Power consumption is hence becoming a significant issue, especially noticeable in integrated circuits such as Static Random-Access memory (SRAM) which can occupy over 60% of die area. Hence, the present study uses Cadence Virtuoso ADE to analyse commonly utilised 4T, 6T and 8T SRAM bit-cell topologies, and quantifies the effect of voltage scaling to sub-threshold levels, process variation and temperature variance on the static noise margins (SNMs), leakage currents and read/write energies. Furthermore, a 4-kb 256 × 16 SRAM module is implemented with 6T cells and shown to operate at 400 mV. It is found that Ultra-Low Voltage (ULV) operation of SRAM can offer over 90% decrease in active power consumption, and upwards of 95% reduction in leakage with a reduction from 1.5 V to 400 mV – albeit at a trade-off with stability margins. Operation at higher temperatures have also demonstrated up to 85% increase of leakage power for an increase of 80 C from ambient. Bachelor of Engineering (Electrical and Electronic Engineering) 2019-06-07T01:40:08Z 2019-06-07T01:40:08Z 2019 Final Year Project (FYP) http://hdl.handle.net/10356/77830 en Nanyang Technological University 97 p. application/pdf
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Wong, Timothy Ting Hin
Ultra-low voltage SRAM design
title Ultra-low voltage SRAM design
title_full Ultra-low voltage SRAM design
title_fullStr Ultra-low voltage SRAM design
title_full_unstemmed Ultra-low voltage SRAM design
title_short Ultra-low voltage SRAM design
title_sort ultra low voltage sram design
topic DRNTU::Engineering::Electrical and electronic engineering
url http://hdl.handle.net/10356/77830
work_keys_str_mv AT wongtimothytinghin ultralowvoltagesramdesign