A step towards automated TEM and SEM characterisation using deep learning : nano-tetrahedrons

Convolutional neural networks (CNNs) have attracted huge amount of attentions since the emergence of deep learning, because of their ability to learn and adapt features directly from the input data, and obtain accurate classification. Although CNNs have resulted in a variety of advances in fields pa...

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Bibliographic Details
Main Author: Tang, Si An
Other Authors: Li Shuzhou
Format: Final Year Project (FYP)
Language:English
Published: 2019
Subjects:
Online Access:http://hdl.handle.net/10356/78727