An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V
Build thickness dependent microstructure of electron beam melted (EBM®) Ti–6Al–4V has been investigated from both experiment and simulation using four block samples with thicknesses of 1, 5, 10 and 20 mm. We observe a mixed microstructure of alternate α/β with some α′ martensite inside the 1 mm-thic...
Main Authors: | , , , , , , , , , |
---|---|
Other Authors: | |
Format: | Journal Article |
Language: | English |
Published: |
2015
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/79369 http://hdl.handle.net/10220/26154 |
_version_ | 1826129824259768320 |
---|---|
author | Tan, Xipeng Kok, Yihong Tan, Yu Jun Vastola, Guglielmo Pei, Qing Xiang Zhang, Gang Zhang, Yong-Wei Tor, Shu Beng Leong, Kah Fai Chua, Chee Kai |
author2 | School of Mechanical and Aerospace Engineering |
author_facet | School of Mechanical and Aerospace Engineering Tan, Xipeng Kok, Yihong Tan, Yu Jun Vastola, Guglielmo Pei, Qing Xiang Zhang, Gang Zhang, Yong-Wei Tor, Shu Beng Leong, Kah Fai Chua, Chee Kai |
author_sort | Tan, Xipeng |
collection | NTU |
description | Build thickness dependent microstructure of electron beam melted (EBM®) Ti–6Al–4V has been investigated from both experiment and simulation using four block samples with thicknesses of 1, 5, 10 and 20 mm. We observe a mixed microstructure of alternate α/β with some α′ martensite inside the 1 mm-thick sample. By contrast, only the alternate α/β microstructure with both colony and basket-weave morphologies occurs inside the 5 mm-, 10 mm- and 20 mm-thick samples. It is found that β spacing is constantly increased with the build thickness, leading to an obvious decrease in microhardness. Finite element method (FEM) simulations show that cooling rates and thermal profiles during EBM process are favorable for the formation of martensite. Moreover, full-scale FEM simulations reveal that the average temperature inside the samples is higher as the build thickness increases. It suggests that martensitic decomposition is faster in thicker samples, which is in good agreement with the experimental observations. |
first_indexed | 2024-10-01T07:46:51Z |
format | Journal Article |
id | ntu-10356/79369 |
institution | Nanyang Technological University |
language | English |
last_indexed | 2024-10-01T07:46:51Z |
publishDate | 2015 |
record_format | dspace |
spelling | ntu-10356/793692023-03-04T17:13:50Z An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V Tan, Xipeng Kok, Yihong Tan, Yu Jun Vastola, Guglielmo Pei, Qing Xiang Zhang, Gang Zhang, Yong-Wei Tor, Shu Beng Leong, Kah Fai Chua, Chee Kai School of Mechanical and Aerospace Engineering DRNTU::Engineering::Materials::Metallic materials::Alloys Build thickness dependent microstructure of electron beam melted (EBM®) Ti–6Al–4V has been investigated from both experiment and simulation using four block samples with thicknesses of 1, 5, 10 and 20 mm. We observe a mixed microstructure of alternate α/β with some α′ martensite inside the 1 mm-thick sample. By contrast, only the alternate α/β microstructure with both colony and basket-weave morphologies occurs inside the 5 mm-, 10 mm- and 20 mm-thick samples. It is found that β spacing is constantly increased with the build thickness, leading to an obvious decrease in microhardness. Finite element method (FEM) simulations show that cooling rates and thermal profiles during EBM process are favorable for the formation of martensite. Moreover, full-scale FEM simulations reveal that the average temperature inside the samples is higher as the build thickness increases. It suggests that martensitic decomposition is faster in thicker samples, which is in good agreement with the experimental observations. Accepted version 2015-06-30T02:55:54Z 2019-12-06T13:23:37Z 2015-06-30T02:55:54Z 2019-12-06T13:23:37Z 2015 2015 Journal Article Tan, X., Kok, Y., Tan, Y. J., Vastola, G., Pei, Q. X., Zhang, G., et al. (2015). An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V. Journal of alloys and compounds, 646, 303-309. 0925-8388 https://hdl.handle.net/10356/79369 http://hdl.handle.net/10220/26154 10.1016/j.jallcom.2015.05.178 187491 en Journal of alloys and compounds © 2015 Elsevier B.V. This is the author created version of a work that has been peer reviewed and accepted for publication by Journal of alloys and compounds, Elsevier B.V. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.jallcom.2015.05.178]. application/pdf |
spellingShingle | DRNTU::Engineering::Materials::Metallic materials::Alloys Tan, Xipeng Kok, Yihong Tan, Yu Jun Vastola, Guglielmo Pei, Qing Xiang Zhang, Gang Zhang, Yong-Wei Tor, Shu Beng Leong, Kah Fai Chua, Chee Kai An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V |
title | An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V |
title_full | An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V |
title_fullStr | An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V |
title_full_unstemmed | An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V |
title_short | An experimental and simulation study on build thickness dependent microstructure for electron beam melted Ti-6Al-4V |
title_sort | experimental and simulation study on build thickness dependent microstructure for electron beam melted ti 6al 4v |
topic | DRNTU::Engineering::Materials::Metallic materials::Alloys |
url | https://hdl.handle.net/10356/79369 http://hdl.handle.net/10220/26154 |
work_keys_str_mv | AT tanxipeng anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT kokyihong anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT tanyujun anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT vastolaguglielmo anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT peiqingxiang anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT zhanggang anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT zhangyongwei anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT torshubeng anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT leongkahfai anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT chuacheekai anexperimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT tanxipeng experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT kokyihong experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT tanyujun experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT vastolaguglielmo experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT peiqingxiang experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT zhanggang experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT zhangyongwei experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT torshubeng experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT leongkahfai experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v AT chuacheekai experimentalandsimulationstudyonbuildthicknessdependentmicrostructureforelectronbeammeltedti6al4v |