Onset of space charge limited current for field emission from a single sharp tip

A protrusive model of the Child-Langmuir (CL) law is proposed for non-uniform electron field emission from a sharp tip of either Lorentzian or hyperboloid shape. The model is expressed as Jc = μ×J1D at large electric field higher than a critical value Ec, and J1D is the classical one-dimensional CL...

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Main Authors: Sun, Sheng, Ang, Ricky Lay Kee
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/79943
http://hdl.handle.net/10220/10216
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author Sun, Sheng
Ang, Ricky Lay Kee
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Sun, Sheng
Ang, Ricky Lay Kee
author_sort Sun, Sheng
collection NTU
description A protrusive model of the Child-Langmuir (CL) law is proposed for non-uniform electron field emission from a sharp tip of either Lorentzian or hyperboloid shape. The model is expressed as Jc = μ×J1D at large electric field higher than a critical value Ec, and J1D is the classical one-dimensional CL law. It is found that the enhancement μ over the 1D CL law depends only on the calculated field enhancement factor (β) of the emitter and is independent of the work function and gap spacing. In particular, μ increases with β and it converges to a constant at β≫ 1 for a very sharp tip with small emission area.
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spelling ntu-10356/799432020-03-07T13:57:22Z Onset of space charge limited current for field emission from a single sharp tip Sun, Sheng Ang, Ricky Lay Kee School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering A protrusive model of the Child-Langmuir (CL) law is proposed for non-uniform electron field emission from a sharp tip of either Lorentzian or hyperboloid shape. The model is expressed as Jc = μ×J1D at large electric field higher than a critical value Ec, and J1D is the classical one-dimensional CL law. It is found that the enhancement μ over the 1D CL law depends only on the calculated field enhancement factor (β) of the emitter and is independent of the work function and gap spacing. In particular, μ increases with β and it converges to a constant at β≫ 1 for a very sharp tip with small emission area. Published version 2013-06-12T02:00:00Z 2019-12-06T13:37:17Z 2013-06-12T02:00:00Z 2019-12-06T13:37:17Z 2012 2012 Journal Article Sun, S., & Ang, L. K. R. (2012). Onset of space charge limited current for field emission from a single sharp tip. Physics of plasmas, 19(3). 1070-664X https://hdl.handle.net/10356/79943 http://hdl.handle.net/10220/10216 10.1063/1.3695090 en Physics of plasmas © 2012 American Institute of Physics. This paper was published in Physics of Plasmas and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3695090]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Sun, Sheng
Ang, Ricky Lay Kee
Onset of space charge limited current for field emission from a single sharp tip
title Onset of space charge limited current for field emission from a single sharp tip
title_full Onset of space charge limited current for field emission from a single sharp tip
title_fullStr Onset of space charge limited current for field emission from a single sharp tip
title_full_unstemmed Onset of space charge limited current for field emission from a single sharp tip
title_short Onset of space charge limited current for field emission from a single sharp tip
title_sort onset of space charge limited current for field emission from a single sharp tip
topic DRNTU::Engineering::Electrical and electronic engineering
url https://hdl.handle.net/10356/79943
http://hdl.handle.net/10220/10216
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