Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches
The noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien fi...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
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2016
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| Online Access: | https://hdl.handle.net/10356/82149 http://hdl.handle.net/10220/41134 |
| _version_ | 1826122972630351872 |
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| author | Qiu, Haodong Wang, Hong Ke, Feixiang |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Qiu, Haodong Wang, Hong Ke, Feixiang |
| author_sort | Qiu, Haodong |
| collection | NTU |
| description | The noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien films, and traps in the alien layer located at the contact interface could play an important role in determining the conduction noise. The conduction fluctuation induced by electron trapping-detrapping associated with the hydrocarbon layer is found to be an intrinsic noise source contributing to the low frequency noise in the unstable contact region. |
| first_indexed | 2024-10-01T05:57:00Z |
| format | Journal Article |
| id | ntu-10356/82149 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:57:00Z |
| publishDate | 2016 |
| record_format | dspace |
| spelling | ntu-10356/821492020-09-26T22:18:20Z Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches Qiu, Haodong Wang, Hong Ke, Feixiang School of Electrical and Electronic Engineering Temasek Laboratories 1/f noise Microelectromechanical systems The noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien films, and traps in the alien layer located at the contact interface could play an important role in determining the conduction noise. The conduction fluctuation induced by electron trapping-detrapping associated with the hydrocarbon layer is found to be an intrinsic noise source contributing to the low frequency noise in the unstable contact region. ASTAR (Agency for Sci., Tech. and Research, S’pore) Published version 2016-08-15T09:12:18Z 2019-12-06T14:47:36Z 2016-08-15T09:12:18Z 2019-12-06T14:47:36Z 2014 Journal Article Qiu, H., Wang, H., & Ke, F. (2014). Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches. Applied Physics Letters, 104(25), 254102-. 0003-6951 https://hdl.handle.net/10356/82149 http://hdl.handle.net/10220/41134 10.1063/1.4886116 en Applied Physics Letters © 2014 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The published version is available at: [http://dx.doi.org/10.1063/1.4886116]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 4 p. application/pdf |
| spellingShingle | 1/f noise Microelectromechanical systems Qiu, Haodong Wang, Hong Ke, Feixiang Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches |
| title | Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches |
| title_full | Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches |
| title_fullStr | Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches |
| title_full_unstemmed | Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches |
| title_short | Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches |
| title_sort | low frequency noise in the unstable contact region of au to au microcontact for microelectromechanical system switches |
| topic | 1/f noise Microelectromechanical systems |
| url | https://hdl.handle.net/10356/82149 http://hdl.handle.net/10220/41134 |
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