Phase Fourier Reconstruction for Anomaly Detection on Metal Surface Using Salient Irregularity

Phase Fourier Reconstruction for Anomaly Detection on Metal Surface Using Salient Irregularity

12 p.

Bibliographic Details
Main Authors: Hung, Tzu-Yi, Vaikundam, Sriram, Natarajan, Vidhya, Chia, Liang-Tien
Other Authors: School of Computer Science and Engineering
Format: Conference Paper
Language:English
Published: 2017
Subjects:
Defect detection
Anomaly detection
Online Access:https://hdl.handle.net/10356/83030
http://hdl.handle.net/10220/42366
Description
Summary:12 p.

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