Identifying key factors towards highly reflective silver coatings
This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigation was made over the crystal orientation and surface roughness, using several types of surfaces, including electroplated Ag polycrystal films, physical vapour deposited polycrystal Ag films, and sing...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2019
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| Online Access: | https://hdl.handle.net/10356/85216 http://hdl.handle.net/10220/48197 |
| _version_ | 1824455313474977792 |
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| author | Zheng, Bo Wong, Lai Peng Wu, Linda Y. L. Chen, Zhong |
| author2 | School of Materials Science & Engineering |
| author_facet | School of Materials Science & Engineering Zheng, Bo Wong, Lai Peng Wu, Linda Y. L. Chen, Zhong |
| author_sort | Zheng, Bo |
| collection | NTU |
| description | This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigation was made over the crystal orientation and surface roughness, using several types of surfaces, including electroplated Ag polycrystal films, physical vapour deposited polycrystal Ag films, and single crystal Ag foils with different crystal orientations. In each type of the surfaces, surface roughness was varied so that, for different combinations of crystal orientation, roughness would elucidate the key factors towards highly reflective Ag coatings. It is found that surface roughness plays a critical role in determining the reflectance, while the crystal orientation has negligible effect. The mean reflectance and one-way ANOVA analysis indicate that the single crystal Ag foils with three orientations performed statistically the same in the same roughness group at significance level 𝛼� = 0.05. Moreover, correlation between the surface reflectance and surface roughness has been proposed for the benefit of coating design. Refection data obtained from the polycrystalline silver samples are used to verify the accuracy of the proposed correlations. It was observed that the development surface area ratio, 𝑆�𝑑�𝑟�, is a better roughness indicator in predicting the reflectance of polycrystalline silver films than the arithmetic average roughness, 𝑅�𝑎�. |
| first_indexed | 2025-02-19T03:36:13Z |
| format | Journal Article |
| id | ntu-10356/85216 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2025-02-19T03:36:13Z |
| publishDate | 2019 |
| record_format | dspace |
| spelling | ntu-10356/852162023-07-14T15:50:34Z Identifying key factors towards highly reflective silver coatings Zheng, Bo Wong, Lai Peng Wu, Linda Y. L. Chen, Zhong School of Materials Science & Engineering Reflectance Coating DRNTU::Engineering::Materials This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigation was made over the crystal orientation and surface roughness, using several types of surfaces, including electroplated Ag polycrystal films, physical vapour deposited polycrystal Ag films, and single crystal Ag foils with different crystal orientations. In each type of the surfaces, surface roughness was varied so that, for different combinations of crystal orientation, roughness would elucidate the key factors towards highly reflective Ag coatings. It is found that surface roughness plays a critical role in determining the reflectance, while the crystal orientation has negligible effect. The mean reflectance and one-way ANOVA analysis indicate that the single crystal Ag foils with three orientations performed statistically the same in the same roughness group at significance level 𝛼� = 0.05. Moreover, correlation between the surface reflectance and surface roughness has been proposed for the benefit of coating design. Refection data obtained from the polycrystalline silver samples are used to verify the accuracy of the proposed correlations. It was observed that the development surface area ratio, 𝑆�𝑑�𝑟�, is a better roughness indicator in predicting the reflectance of polycrystalline silver films than the arithmetic average roughness, 𝑅�𝑎�. Published version 2019-05-15T01:20:14Z 2019-12-06T15:59:39Z 2019-05-15T01:20:14Z 2019-12-06T15:59:39Z 2017 Journal Article Zheng, B., Wong, L. P., Wu, L. Y. L., & Chen, Z. (2017). Identifying key factors towards highly reflective silver coatings. Advances in Materials Science and Engineering, 2017, 7686983-. doi:10.1155/2017/7686983 1687-8434 https://hdl.handle.net/10356/85216 http://hdl.handle.net/10220/48197 10.1155/2017/7686983 en Advances in Materials Science and Engineering © 2017 Bo Zheng et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. 12 p. application/pdf |
| spellingShingle | Reflectance Coating DRNTU::Engineering::Materials Zheng, Bo Wong, Lai Peng Wu, Linda Y. L. Chen, Zhong Identifying key factors towards highly reflective silver coatings |
| title | Identifying key factors towards highly reflective silver coatings |
| title_full | Identifying key factors towards highly reflective silver coatings |
| title_fullStr | Identifying key factors towards highly reflective silver coatings |
| title_full_unstemmed | Identifying key factors towards highly reflective silver coatings |
| title_short | Identifying key factors towards highly reflective silver coatings |
| title_sort | identifying key factors towards highly reflective silver coatings |
| topic | Reflectance Coating DRNTU::Engineering::Materials |
| url | https://hdl.handle.net/10356/85216 http://hdl.handle.net/10220/48197 |
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