Epitaxial BiFeO3 thin films on Si
BiFeO3 was studied as an alternative environmentally clean ferro/piezoelectric material. 200-nm-thick BiFeO3 films were grown on Si substrates with SrTiO3 as a template layer and SrRuO3 as bottom electrode. X-ray and transmission electron...
Main Authors: | , , , , , , , , |
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Format: | Journal Article |
Language: | English |
Published: |
2011
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Online Access: | https://hdl.handle.net/10356/85279 http://hdl.handle.net/10220/6902 |
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author | Droopad, R. Yu, J. Wang, J. Zheng, H. Ma, Z. Prasertchoung, S. Wuttig, M. Eisenbeiser, K. Ramesh, R. |
author2 | School of Materials Science & Engineering |
author_facet | School of Materials Science & Engineering Droopad, R. Yu, J. Wang, J. Zheng, H. Ma, Z. Prasertchoung, S. Wuttig, M. Eisenbeiser, K. Ramesh, R. |
author_sort | Droopad, R. |
collection | NTU |
description | BiFeO3 was studied as an alternative environmentally clean ferro/piezoelectric material.
200-nm-thick BiFeO3 films were grown on Si substrates with SrTiO3 as a template layer and
SrRuO3 as bottom electrode. X-ray and transmission electron microscopy studies confirmed the epitaxial growth of the films. The spontaneous polarization of the films was ~45μC/cm2.
Retention measurement up to several days showed no decay of polarization. A piezoelectric
coefficient (d33) of ~60 pm/V was observed, which is promising for applications in
micro-electro-mechanical systems and actuators. |
first_indexed | 2025-02-19T03:21:16Z |
format | Journal Article |
id | ntu-10356/85279 |
institution | Nanyang Technological University |
language | English |
last_indexed | 2025-02-19T03:21:16Z |
publishDate | 2011 |
record_format | dspace |
spelling | ntu-10356/852792023-07-14T15:45:33Z Epitaxial BiFeO3 thin films on Si Droopad, R. Yu, J. Wang, J. Zheng, H. Ma, Z. Prasertchoung, S. Wuttig, M. Eisenbeiser, K. Ramesh, R. School of Materials Science & Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics BiFeO3 was studied as an alternative environmentally clean ferro/piezoelectric material. 200-nm-thick BiFeO3 films were grown on Si substrates with SrTiO3 as a template layer and SrRuO3 as bottom electrode. X-ray and transmission electron microscopy studies confirmed the epitaxial growth of the films. The spontaneous polarization of the films was ~45μC/cm2. Retention measurement up to several days showed no decay of polarization. A piezoelectric coefficient (d33) of ~60 pm/V was observed, which is promising for applications in micro-electro-mechanical systems and actuators. Published version 2011-07-14T03:47:22Z 2019-12-06T16:00:49Z 2011-07-14T03:47:22Z 2019-12-06T16:00:49Z 2004 2004 Journal Article Wang, J., Zheng, H., Ma, Z., Prasertchoung, S., Wuttig, M., Droopad, R., et al. (2004). Epitaxial BiFeO3 Thin Films on Si. Applied Physics Letters, 85(13), 2574-2576. https://hdl.handle.net/10356/85279 http://hdl.handle.net/10220/6902 10.1063/1.1799234 en Applied physics letters © 2004 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.1799234. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 3 p. application/pdf |
spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Microelectronics Droopad, R. Yu, J. Wang, J. Zheng, H. Ma, Z. Prasertchoung, S. Wuttig, M. Eisenbeiser, K. Ramesh, R. Epitaxial BiFeO3 thin films on Si |
title | Epitaxial BiFeO3 thin films on Si |
title_full | Epitaxial BiFeO3 thin films on Si |
title_fullStr | Epitaxial BiFeO3 thin films on Si |
title_full_unstemmed | Epitaxial BiFeO3 thin films on Si |
title_short | Epitaxial BiFeO3 thin films on Si |
title_sort | epitaxial bifeo3 thin films on si |
topic | DRNTU::Engineering::Electrical and electronic engineering::Microelectronics |
url | https://hdl.handle.net/10356/85279 http://hdl.handle.net/10220/6902 |
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