Understanding the defect structure of solution grown zinc oxide
Zinc oxide (ZnO) is a wide bandgap semiconducting oxide with many potential applications in various optoelectronic devices such as light emitting diodes (LEDs) and field effect transistors (FETs). Much effort has been made to understand the ZnO structure and its defects. However, one major issue in...
| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2013
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| Online Access: | https://hdl.handle.net/10356/85283 http://hdl.handle.net/10220/11272 |
| _version_ | 1826119597943685120 |
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| author | Liew, Laura-Lynn. Sankar, Gopinathan. Goh, Gregory K. L. Kohara, Shinji. Handoko, Albertus Denny. |
| author2 | School of Materials Science & Engineering |
| author_facet | School of Materials Science & Engineering Liew, Laura-Lynn. Sankar, Gopinathan. Goh, Gregory K. L. Kohara, Shinji. Handoko, Albertus Denny. |
| author_sort | Liew, Laura-Lynn. |
| collection | NTU |
| description | Zinc oxide (ZnO) is a wide bandgap semiconducting oxide with many potential applications in various optoelectronic devices such as light emitting diodes (LEDs) and field effect transistors (FETs). Much effort has been made to understand the ZnO structure and its defects. However, one major issue in determining whether it is Zn or O deficiency that provides ZnO its unique properties remains. X-ray absorption spectroscopy (XAS) is an ideal, atom specific characterization technique that is able to probe defect structure in many materials, including ZnO. In this paper, comparative studies of bulk and aqueous solution grown (≤90 °C) ZnO powders using XAS and x-ray pair distribution function (XPDF) techniques are described. The XAS Zn–Zn correlation and XPDF results undoubtedly point out that the solution grown ZnO contains Zn deficiency, rather than the O deficiency that were commonly reported. This understanding of ZnO short range order and structure will be invaluable for further development of solid state lighting and other optoelectronic device applications. |
| first_indexed | 2024-10-01T05:02:40Z |
| format | Journal Article |
| id | ntu-10356/85283 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:02:40Z |
| publishDate | 2013 |
| record_format | dspace |
| spelling | ntu-10356/852832020-06-01T10:26:46Z Understanding the defect structure of solution grown zinc oxide Liew, Laura-Lynn. Sankar, Gopinathan. Goh, Gregory K. L. Kohara, Shinji. Handoko, Albertus Denny. School of Materials Science & Engineering Zinc oxide (ZnO) is a wide bandgap semiconducting oxide with many potential applications in various optoelectronic devices such as light emitting diodes (LEDs) and field effect transistors (FETs). Much effort has been made to understand the ZnO structure and its defects. However, one major issue in determining whether it is Zn or O deficiency that provides ZnO its unique properties remains. X-ray absorption spectroscopy (XAS) is an ideal, atom specific characterization technique that is able to probe defect structure in many materials, including ZnO. In this paper, comparative studies of bulk and aqueous solution grown (≤90 °C) ZnO powders using XAS and x-ray pair distribution function (XPDF) techniques are described. The XAS Zn–Zn correlation and XPDF results undoubtedly point out that the solution grown ZnO contains Zn deficiency, rather than the O deficiency that were commonly reported. This understanding of ZnO short range order and structure will be invaluable for further development of solid state lighting and other optoelectronic device applications. 2013-07-12T02:51:02Z 2019-12-06T16:00:53Z 2013-07-12T02:51:02Z 2019-12-06T16:00:53Z 2012 2012 Journal Article Liew, L. L., Sankar, G., Handoko, A. D., Goh, G. K., & Kohara, S. (2012). Understanding the defect structure of solution grown zinc oxide. Journal of Solid State Chemistry, 189, 63-67. 0022-4596 https://hdl.handle.net/10356/85283 http://hdl.handle.net/10220/11272 10.1016/j.jssc.2012.01.011 en Journal of solid state chemistry © 2012 Published by Elsevier Inc. |
| spellingShingle | Liew, Laura-Lynn. Sankar, Gopinathan. Goh, Gregory K. L. Kohara, Shinji. Handoko, Albertus Denny. Understanding the defect structure of solution grown zinc oxide |
| title | Understanding the defect structure of solution grown zinc oxide |
| title_full | Understanding the defect structure of solution grown zinc oxide |
| title_fullStr | Understanding the defect structure of solution grown zinc oxide |
| title_full_unstemmed | Understanding the defect structure of solution grown zinc oxide |
| title_short | Understanding the defect structure of solution grown zinc oxide |
| title_sort | understanding the defect structure of solution grown zinc oxide |
| url | https://hdl.handle.net/10356/85283 http://hdl.handle.net/10220/11272 |
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