The revised m-of-k runs rule based on median run length

Runs rules are used to increase the sensitivity of the Shewhart X control chart in detecting small and moderate process mean shifts. Most of the X charts incorporating runs rules are designed based on the average run length (ARL). It is known that the shape of the run length distribution change...

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Bibliografski detalji
Glavni autori: Low, Chun Kit., Khoo, Michael B. C., Teoh, Wei Lin., Wu, Zhang.
Daljnji autori: School of Mechanical and Aerospace Engineering
Format: Journal Article
Jezik:English
Izdano: 2013
Online pristup:https://hdl.handle.net/10356/85389
http://hdl.handle.net/10220/13057

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