The revised m-of-k runs rule based on median run length
Runs rules are used to increase the sensitivity of the Shewhart X control chart in detecting small and moderate process mean shifts. Most of the X charts incorporating runs rules are designed based on the average run length (ARL). It is known that the shape of the run length distribution change...
Main Authors: | Low, Chun Kit., Khoo, Michael B. C., Teoh, Wei Lin., Wu, Zhang. |
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Other Authors: | School of Mechanical and Aerospace Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2013
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Online Access: | https://hdl.handle.net/10356/85389 http://hdl.handle.net/10220/13057 |
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