Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry
High-resolution cameras used for smartphones are comprised of multiple aspheric lenses, a spectral filter, and a semiconductor image sensor, which are packaged together into a single module with tight geometrical tolerances. We investigated the technical possibility of near-infrared low-coherence in...
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2018
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/87274 http://hdl.handle.net/10220/44387 |
| _version_ | 1811696579340402688 |
|---|---|
| author | Lee, Chang-Yun Hyun, Sang-Won Kim, Young-Jin Kim, Seung-Woo |
| author2 | School of Mechanical and Aerospace Engineering |
| author_facet | School of Mechanical and Aerospace Engineering Lee, Chang-Yun Hyun, Sang-Won Kim, Young-Jin Kim, Seung-Woo |
| author_sort | Lee, Chang-Yun |
| collection | NTU |
| description | High-resolution cameras used for smartphones are comprised of multiple aspheric lenses, a spectral filter, and a semiconductor image sensor, which are packaged together into a single module with tight geometrical tolerances. We investigated the technical possibility of near-infrared low-coherence interferometry for nondestructive geometrical inspection of the complex camera module to examine the inside packaging state. This tomographic scheme enabled us to measure the relative axial position of each inside component and also the lateral surface profile of the image sensor, allowing for comprehensive three-dimensional quality assurance of the whole camera module during the packaging process. |
| first_indexed | 2024-10-01T07:41:36Z |
| format | Journal Article |
| id | ntu-10356/87274 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T07:41:36Z |
| publishDate | 2018 |
| record_format | dspace |
| spelling | ntu-10356/872742023-03-04T17:15:21Z Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry Lee, Chang-Yun Hyun, Sang-Won Kim, Young-Jin Kim, Seung-Woo School of Mechanical and Aerospace Engineering Low-coherence Interferometry Camera Module High-resolution cameras used for smartphones are comprised of multiple aspheric lenses, a spectral filter, and a semiconductor image sensor, which are packaged together into a single module with tight geometrical tolerances. We investigated the technical possibility of near-infrared low-coherence interferometry for nondestructive geometrical inspection of the complex camera module to examine the inside packaging state. This tomographic scheme enabled us to measure the relative axial position of each inside component and also the lateral surface profile of the image sensor, allowing for comprehensive three-dimensional quality assurance of the whole camera module during the packaging process. Published version 2018-02-02T07:46:13Z 2019-12-06T16:38:41Z 2018-02-02T07:46:13Z 2019-12-06T16:38:41Z 2016 Journal Article Lee, C.-Y., Hyun, S.-W., Kim, Y.-J., & Kim, S.-W. (2016). Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry. Optical Engineering, 55(9), 091404-. 0091-3286 https://hdl.handle.net/10356/87274 http://hdl.handle.net/10220/44387 10.1117/1.OE.55.9.091404 en Optical Engineering © 2016 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Optical Engineering and is made available as an electronic reprint (preprint) with permission of SPIE. The published version is available at: [http://dx.doi.org/10.1117/1.OE.55.9.091404]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 6 p. application/pdf |
| spellingShingle | Low-coherence Interferometry Camera Module Lee, Chang-Yun Hyun, Sang-Won Kim, Young-Jin Kim, Seung-Woo Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry |
| title | Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry |
| title_full | Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry |
| title_fullStr | Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry |
| title_full_unstemmed | Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry |
| title_short | Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry |
| title_sort | optical inspection of smartphone camera modules by near infrared low coherence interferometry |
| topic | Low-coherence Interferometry Camera Module |
| url | https://hdl.handle.net/10356/87274 http://hdl.handle.net/10220/44387 |
| work_keys_str_mv | AT leechangyun opticalinspectionofsmartphonecameramodulesbynearinfraredlowcoherenceinterferometry AT hyunsangwon opticalinspectionofsmartphonecameramodulesbynearinfraredlowcoherenceinterferometry AT kimyoungjin opticalinspectionofsmartphonecameramodulesbynearinfraredlowcoherenceinterferometry AT kimseungwoo opticalinspectionofsmartphonecameramodulesbynearinfraredlowcoherenceinterferometry |