High-resolution transport-of-intensity quantitative phase microscopy with annular illumination

High-resolution transport-of-intensity quantitative phase microscopy with annular illumination

For quantitative phase imaging (QPI) based on transport-of-intensity equation (TIE), partially coherent illumination provides speckle-free imaging, compatibility with brightfield microscopy, and transverse resolution beyond coherent diffraction limit. Unfortunately, in a conventional microscope with...

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Bibliographic Details
Main Authors: Zuo, Chao, Sun, Jiasong, Li, Jiaji, Zhang, Jialin, Asundi, Anand, Chen, Qian
Other Authors: School of Mechanical and Aerospace Engineering
Format: Journal Article
Language:English
Published: 2018
Subjects:
DRNTU::Engineering::Mechanical engineering
Transport-of-intensity Equation
Microscopy
Online Access:https://hdl.handle.net/10356/87905
http://hdl.handle.net/10220/45587

Internet

https://hdl.handle.net/10356/87905
http://hdl.handle.net/10220/45587

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