High-resolution transport-of-intensity quantitative phase microscopy with annular illumination

High-resolution transport-of-intensity quantitative phase microscopy with annular illumination

For quantitative phase imaging (QPI) based on transport-of-intensity equation (TIE), partially coherent illumination provides speckle-free imaging, compatibility with brightfield microscopy, and transverse resolution beyond coherent diffraction limit. Unfortunately, in a conventional microscope with...

Szczegółowa specyfikacja

Opis bibliograficzny
Główni autorzy:	Zuo, Chao, Sun, Jiasong, Li, Jiaji, Zhang, Jialin, Asundi, Anand, Chen, Qian
Kolejni autorzy:	School of Mechanical and Aerospace Engineering
Format:	Journal Article
Język:	English
Wydane:	2018
Hasła przedmiotowe:	DRNTU::Engineering::Mechanical engineering Transport-of-intensity Equation Microscopy
Dostęp online:	https://hdl.handle.net/10356/87905 http://hdl.handle.net/10220/45587

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