Fine electron biprism on a Si-on-insulator chip for off-axis electron holography
Off-axis electron holography allows both the amplitude and the phase shift of an electron wavefield propagating through a specimen in a transmission electron microscope to be recovered. The technique requires the use of an electron biprism to deflect an object wave and a reference wave to form an in...
| Main Authors: | , , , , , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2019
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/90287 http://hdl.handle.net/10220/48487 |
| _version_ | 1811693555331104768 |
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| author | Duchamp, Martial Girard, Olivier Pozzi, Giulio Soltner, Helmut Winkler, Florian Speen, Rolf Dunin-Borkowski, Rafal E. Cooper, David |
| author2 | School of Materials Science & Engineering |
| author_facet | School of Materials Science & Engineering Duchamp, Martial Girard, Olivier Pozzi, Giulio Soltner, Helmut Winkler, Florian Speen, Rolf Dunin-Borkowski, Rafal E. Cooper, David |
| author_sort | Duchamp, Martial |
| collection | NTU |
| description | Off-axis electron holography allows both the amplitude and the phase shift of an electron wavefield propagating through a specimen in a transmission electron microscope to be recovered. The technique requires the use of an electron biprism to deflect an object wave and a reference wave to form an interference pattern. Here, we introduce an approach based on semiconductor processing technology to fabricate fine electron biprisms with rectangular cross-sections. By performing electrostatic calculations and preliminary experiments, we demonstrate that such biprisms promise improved performance for electron holography experiments. |
| first_indexed | 2024-10-01T06:53:32Z |
| format | Journal Article |
| id | ntu-10356/90287 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T06:53:32Z |
| publishDate | 2019 |
| record_format | dspace |
| spelling | ntu-10356/902872023-07-14T15:52:56Z Fine electron biprism on a Si-on-insulator chip for off-axis electron holography Duchamp, Martial Girard, Olivier Pozzi, Giulio Soltner, Helmut Winkler, Florian Speen, Rolf Dunin-Borkowski, Rafal E. Cooper, David School of Materials Science & Engineering Electron Biprism DRNTU::Engineering::Materials Off-axis electron holography allows both the amplitude and the phase shift of an electron wavefield propagating through a specimen in a transmission electron microscope to be recovered. The technique requires the use of an electron biprism to deflect an object wave and a reference wave to form an interference pattern. Here, we introduce an approach based on semiconductor processing technology to fabricate fine electron biprisms with rectangular cross-sections. By performing electrostatic calculations and preliminary experiments, we demonstrate that such biprisms promise improved performance for electron holography experiments. Published version 2019-05-30T05:07:30Z 2019-12-06T17:44:51Z 2019-05-30T05:07:30Z 2019-12-06T17:44:51Z 2017 Journal Article Duchamp, M., Girard, O., Pozzi, G., Soltner, H., Winkler, F., Speen, R., . . . Cooper, D. (2017). Fine electron biprism on a Si-on-insulator chip for off-axis electron holography. Ultramicroscopy, 185, 81-89. doi:10.1016/j.ultramic.2017.11.012 0304-3991 https://hdl.handle.net/10356/90287 http://hdl.handle.net/10220/48487 10.1016/j.ultramic.2017.11.012 en Ultramicroscopy © 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license. (http://creativecommons.org/licenses/by-nc-nd/4.0/) 9 p. application/pdf |
| spellingShingle | Electron Biprism DRNTU::Engineering::Materials Duchamp, Martial Girard, Olivier Pozzi, Giulio Soltner, Helmut Winkler, Florian Speen, Rolf Dunin-Borkowski, Rafal E. Cooper, David Fine electron biprism on a Si-on-insulator chip for off-axis electron holography |
| title | Fine electron biprism on a Si-on-insulator chip for off-axis electron holography |
| title_full | Fine electron biprism on a Si-on-insulator chip for off-axis electron holography |
| title_fullStr | Fine electron biprism on a Si-on-insulator chip for off-axis electron holography |
| title_full_unstemmed | Fine electron biprism on a Si-on-insulator chip for off-axis electron holography |
| title_short | Fine electron biprism on a Si-on-insulator chip for off-axis electron holography |
| title_sort | fine electron biprism on a si on insulator chip for off axis electron holography |
| topic | Electron Biprism DRNTU::Engineering::Materials |
| url | https://hdl.handle.net/10356/90287 http://hdl.handle.net/10220/48487 |
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