Determination of material parameters from regions close to the collector using electron beam-induced current
The conventional method of extracting the minority carrier diffusion length using the electron beam-induced current (EBIC) technique requires that the electron beam be placed at region more than two diffusion lengths away from the collector. The EBIC signals obtained under this condition usually has...
| Үндсэн зохиолчид: | , |
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| Бусад зохиолчид: | |
| Формат: | Journal Article |
| Хэл сонгох: | English |
| Хэвлэсэн: |
2009
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| Нөхцлүүд: | |
| Онлайн хандалт: | https://hdl.handle.net/10356/90975 http://hdl.handle.net/10220/5341 |