Multiple regression models for electronic product success prediction

As the cost of failure in new product development is very high, product developers are looking for good product success/failure prediction models. The general direction of search is towards Knowledge Based Systems (KBS) that incorporate the wisdom of experienced developers and extracts from data of...

Ausführliche Beschreibung

Bibliographische Detailangaben
Hauptverfasser: Lo, Frank Cheong Wah, Foo, Say Wei, Bauly, John A.
Weitere Verfasser: IEEE International Conference on Management of Innovation and Technology (1st : 2000 : Singapore)
Format: Conference Paper
Sprache:English
Veröffentlicht: 2009
Online Zugang:https://hdl.handle.net/10356/91312
http://hdl.handle.net/10220/4587
http://sfxna09.hosted.exlibrisgroup.com:3410/ntu/sfxlcl3?sid=metalib:EVII&id=doi:10.1109/ICMIT.2000.917374&genre=&isbn=0 7803 6652 2&issn=&date=2000&volume=&issue=&spage=419&epage=22&aulast=Lo&aufirst=%20F%20C%20%2DW&auinit=&title=Proceedings%20of%20the%202000%20IEEE%20International%20Conference%20on%20Management%20of%20Innovation%20and%20Technology%2E%20ICMIT%202000%2E%20%60Management%20in%20the%2021st%20Century%27%20%28Cat%2E%20No%2E00EX457%29&atitle=Multiple%20regression%20models%20for%20electronic%20product%20success%20prediction

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