An efficient method for parametric yield gradient estimation
A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Conference Paper |
| Language: | English |
| Published: |
2009
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| Online Access: | https://hdl.handle.net/10356/91590 http://hdl.handle.net/10220/5850 |
| _version_ | 1826111878809518080 |
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| author | Wu, Ting Foo, Say Wei |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Wu, Ting Foo, Say Wei |
| author_sort | Wu, Ting |
| collection | NTU |
| description | A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach. |
| first_indexed | 2024-10-01T02:58:04Z |
| format | Conference Paper |
| id | ntu-10356/91590 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T02:58:04Z |
| publishDate | 2009 |
| record_format | dspace |
| spelling | ntu-10356/915902020-03-07T13:24:46Z An efficient method for parametric yield gradient estimation Wu, Ting Foo, Say Wei School of Electrical and Electronic Engineering IEEE International Symposium on Circuits and Systems (1999 : Orlando, Florida, US) DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering A novel method to improve the yield gradient estimation in parametric yield optimization is proposed. By introducing some deterministic information into the conventional Monte Carlo method and fully utilizing the samples, it is possible to obtain yield gradient estimation with significantly smaller variance. The additional computation is almost negligible. Examples are presented to indicate the efficiency of this approach. Published version 2009-07-29T08:55:47Z 2019-12-06T18:08:29Z 2009-07-29T08:55:47Z 2019-12-06T18:08:29Z 1999 1999 Conference Paper Wu, T., & Foo, S. W. (1999). An efficient method for parametric yield gradient estimation. In Proceedings of the IEEE International Symposium on Circuits and Systems, (pp. 419-422). Singapore: National University of Singapore. https://hdl.handle.net/10356/91590 http://hdl.handle.net/10220/5850 10.1109/ISCAS.1999.777897 en © IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site 4 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering Wu, Ting Foo, Say Wei An efficient method for parametric yield gradient estimation |
| title | An efficient method for parametric yield gradient estimation |
| title_full | An efficient method for parametric yield gradient estimation |
| title_fullStr | An efficient method for parametric yield gradient estimation |
| title_full_unstemmed | An efficient method for parametric yield gradient estimation |
| title_short | An efficient method for parametric yield gradient estimation |
| title_sort | efficient method for parametric yield gradient estimation |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering |
| url | https://hdl.handle.net/10356/91590 http://hdl.handle.net/10220/5850 |
| work_keys_str_mv | AT wuting anefficientmethodforparametricyieldgradientestimation AT foosaywei anefficientmethodforparametricyieldgradientestimation AT wuting efficientmethodforparametricyieldgradientestimation AT foosaywei efficientmethodforparametricyieldgradientestimation |