Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc-Al/AlN thin film system has been investigated. It is shown that the UV illumination could lead to a random chang...

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Main Authors: Liu, Zhen, Chen, Tupei, Liu, Yang, Ding, Liang, Yang, Ming, Wong, Jen It, Cen, Zhan Hong, Li, Yibin, Zhang, Sam, Fung, Stevenson Hon Yuen
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2010
Subjects:
Online Access:https://hdl.handle.net/10356/91842
http://hdl.handle.net/10220/6402
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author Liu, Zhen
Chen, Tupei
Liu, Yang
Ding, Liang
Yang, Ming
Wong, Jen It
Cen, Zhan Hong
Li, Yibin
Zhang, Sam
Fung, Stevenson Hon Yuen
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Liu, Zhen
Chen, Tupei
Liu, Yang
Ding, Liang
Yang, Ming
Wong, Jen It
Cen, Zhan Hong
Li, Yibin
Zhang, Sam
Fung, Stevenson Hon Yuen
author_sort Liu, Zhen
collection NTU
description Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc-Al/AlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination.
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spelling ntu-10356/918422020-03-07T13:57:27Z Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals Liu, Zhen Chen, Tupei Liu, Yang Ding, Liang Yang, Ming Wong, Jen It Cen, Zhan Hong Li, Yibin Zhang, Sam Fung, Stevenson Hon Yuen School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc-Al/AlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination. Published version 2010-09-06T01:13:47Z 2019-12-06T18:12:54Z 2010-09-06T01:13:47Z 2019-12-06T18:12:54Z 2008 2008 Journal Article Liu, Z., Chen, T. P., Liu, Y., Ding, L., Yang, M., Wong, J. I., et al. (2008). Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals. Applied Physics Letters, 92, 1-3. 0003-6951 https://hdl.handle.net/10356/91842 http://hdl.handle.net/10220/6402 10.1063/1.2828691 en Applied physics letters Applied Physics Letters © copyright 2008 American Institute of Physics. The journal's website is located at http://apl.aip.org/applab/v92/i1/p013102_s1?isAuthorized=no 3 p. application/pdf
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
Liu, Zhen
Chen, Tupei
Liu, Yang
Ding, Liang
Yang, Ming
Wong, Jen It
Cen, Zhan Hong
Li, Yibin
Zhang, Sam
Fung, Stevenson Hon Yuen
Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
title Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
title_full Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
title_fullStr Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
title_full_unstemmed Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
title_short Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
title_sort light induced instability in current conduction of aluminum nitride thin films embedded with al nanocrystals
topic DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
url https://hdl.handle.net/10356/91842
http://hdl.handle.net/10220/6402
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