Charge collection from within a collecting junction well
This paper provides the analytical equation for the charge collection from a collecting region with a finite dimension. Electron-beam-induced current has widely been used for semiconductor characterization. The availability of analytical expressions would further enhance the study and development of...
| Main Authors: | , |
|---|---|
| Andre forfattere: | |
| Format: | Journal Article |
| Sprog: | English |
| Udgivet: |
2010
|
| Fag: | |
| Online adgang: | https://hdl.handle.net/10356/92634 http://hdl.handle.net/10220/6270 |