X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials
Abstract not available.
| Main Author: | |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2013
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| Online Access: | https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215 |
| _version_ | 1811693556154236928 |
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| author | Dong, Zhili |
| author2 | School of Materials Science & Engineering |
| author_facet | School of Materials Science & Engineering Dong, Zhili |
| author_sort | Dong, Zhili |
| collection | NTU |
| description | Abstract not available. |
| first_indexed | 2024-10-01T06:53:33Z |
| format | Journal Article |
| id | ntu-10356/93970 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T06:53:33Z |
| publishDate | 2013 |
| record_format | dspace |
| spelling | ntu-10356/939702020-06-01T10:26:49Z X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials Dong, Zhili School of Materials Science & Engineering Abstract not available. 2013-02-21T07:08:57Z 2019-12-06T18:48:37Z 2013-02-21T07:08:57Z 2019-12-06T18:48:37Z 2009 2009 Journal Article Dong, Z. L. (2009). X-ray diffraction, Rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials. Handbook of Nanoceramics and Their Based Nanodevices (pp. 303-336). USA: American Scientific Publishers. https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215 en Handbook of nanoceramics and their based nanodevices © 2009 American Scientific Publishers. |
| spellingShingle | Dong, Zhili X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title | X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_full | X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_fullStr | X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_full_unstemmed | X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_short | X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials |
| title_sort | x ray diffraction rietveld crystal structure refinement and high resolution transmission electron microscopy of nano structured materials |
| url | https://hdl.handle.net/10356/93970 http://hdl.handle.net/10220/9215 |
| work_keys_str_mv | AT dongzhili xraydiffractionrietveldcrystalstructurerefinementandhighresolutiontransmissionelectronmicroscopyofnanostructuredmaterials |