Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up...
| Päätekijät: | , , , , , , , |
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| Muut tekijät: | |
| Aineistotyyppi: | Journal Article |
| Kieli: | English |
| Julkaistu: |
2012
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| Aiheet: | |
| Linkit: | https://hdl.handle.net/10356/94736 http://hdl.handle.net/10220/8513 |
| _version_ | 1826118398735548416 |
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| author | Ni, Zhenhua Lee, Pooi See Shen, Zexiang Kasim, J. Tee, X. Y. You, Y. M. Setiawan, Y. Chan, L. |
| author2 | School of Materials Science & Engineering |
| author_facet | School of Materials Science & Engineering Ni, Zhenhua Lee, Pooi See Shen, Zexiang Kasim, J. Tee, X. Y. You, Y. M. Setiawan, Y. Chan, L. |
| author_sort | Ni, Zhenhua |
| collection | NTU |
| description | Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up to 25.4 times as compared to that without a silver coating. This technique will be very useful for Raman study on samples that suffer overlapping background signal. In this article, we show that it can be used to significantly improve the signal of thin strained-Si layer on top of SiGe buffer layer. |
| first_indexed | 2024-10-01T04:42:46Z |
| format | Journal Article |
| id | ntu-10356/94736 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T04:42:46Z |
| publishDate | 2012 |
| record_format | dspace |
| spelling | ntu-10356/947362020-06-01T10:21:17Z Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization Ni, Zhenhua Lee, Pooi See Shen, Zexiang Kasim, J. Tee, X. Y. You, Y. M. Setiawan, Y. Chan, L. School of Materials Science & Engineering DRNTU::Engineering::Materials Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up to 25.4 times as compared to that without a silver coating. This technique will be very useful for Raman study on samples that suffer overlapping background signal. In this article, we show that it can be used to significantly improve the signal of thin strained-Si layer on top of SiGe buffer layer. 2012-09-13T03:32:45Z 2019-12-06T19:01:14Z 2012-09-13T03:32:45Z 2019-12-06T19:01:14Z 2008 2008 Journal Article Kasim, J., Tee, X. Y., You, Y. M., Ni, Z. H., Setiawan, Y., Lee, P. S., et al. (2008). Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization. Journal of raman spectroscopy, 39(10), 1338-1342. https://hdl.handle.net/10356/94736 http://hdl.handle.net/10220/8513 10.1002/jrs.1999 en Journal of Raman spectroscopy © 2008 John Wiley & Sons, Ltd. |
| spellingShingle | DRNTU::Engineering::Materials Ni, Zhenhua Lee, Pooi See Shen, Zexiang Kasim, J. Tee, X. Y. You, Y. M. Setiawan, Y. Chan, L. Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization |
| title | Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization |
| title_full | Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization |
| title_fullStr | Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization |
| title_full_unstemmed | Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization |
| title_short | Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization |
| title_sort | plasmon enhanced polarized raman spectroscopy for sensitive surface characterization |
| topic | DRNTU::Engineering::Materials |
| url | https://hdl.handle.net/10356/94736 http://hdl.handle.net/10220/8513 |
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