Thickness dependency of field emission in amorphous and nanostructured carbon thin films
Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the...
Main Authors: | Shakerzadeh, Maziar, Teo, Edwin Hang Tong, Tay, Beng Kang |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/94809 http://hdl.handle.net/10220/9318 |
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