Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers
Pulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-a...
Main Authors: | Zhang, Hua, Müllen, Klaus, De Feyter, Steven |
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Other Authors: | School of Materials Science & Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/95586 http://hdl.handle.net/10220/8605 |
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