Ferroelectric tunnel junction memory devices made from monolayers of vinylidene fluoride oligomers
Conductance bistability in Pt/Si–vinylidene fluoride (VDF) oligomer–Au ferroelectric tunnel junction devices is demonstrated. I–V and C–V measurements reveal bistable conductance switching within biasing voltage of ±0.5V with stable memory retention up to 1 × 104 cycles. The memory element exhibits...
Main Authors: | Kusuma, Damar Yoga, Lee, Pooi See |
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Other Authors: | School of Materials Science & Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2013
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Online Access: | https://hdl.handle.net/10356/97095 http://hdl.handle.net/10220/10458 |
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