Circuits design for contactless testing of nano-scale CMOS devices and circuits
In this letter, a contactless testing system for nano-scale CMOS devices is presented. It includes parameter-specific ring oscillators, modulator and demodulator with capacitive coupling, which can be fully integrated in a standard CMOS technology. These ring oscillators are used to monitor process...
| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2013
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/99587 http://hdl.handle.net/10220/13663 |
| _version_ | 1826123369775366144 |
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| author | Yu, Xiao Peng Lu, Zhenghao Lim, Wei Meng Liu, Yang Hu, Chang Hui |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Yu, Xiao Peng Lu, Zhenghao Lim, Wei Meng Liu, Yang Hu, Chang Hui |
| author_sort | Yu, Xiao Peng |
| collection | NTU |
| description | In this letter, a contactless testing system for nano-scale CMOS devices is presented. It includes parameter-specific ring oscillators, modulator and demodulator with capacitive coupling, which can be fully integrated in a standard CMOS technology. These ring oscillators are used to monitor process variations, while their outputs are modulated and coupled to a demodulator for measurement. The circuits are designed and simulated in standard 40 nm CMOS technology and are able to work robustly against process variations. The system is suitable in contactless testing or built-in self-test for nano-scale CMOS technology with power consumption less than 1 mW and data-rate of 10 Mbps at 3 GHz carrier. |
| first_indexed | 2024-10-01T06:03:32Z |
| format | Journal Article |
| id | ntu-10356/99587 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T06:03:32Z |
| publishDate | 2013 |
| record_format | dspace |
| spelling | ntu-10356/995872020-03-07T14:00:31Z Circuits design for contactless testing of nano-scale CMOS devices and circuits Yu, Xiao Peng Lu, Zhenghao Lim, Wei Meng Liu, Yang Hu, Chang Hui School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering In this letter, a contactless testing system for nano-scale CMOS devices is presented. It includes parameter-specific ring oscillators, modulator and demodulator with capacitive coupling, which can be fully integrated in a standard CMOS technology. These ring oscillators are used to monitor process variations, while their outputs are modulated and coupled to a demodulator for measurement. The circuits are designed and simulated in standard 40 nm CMOS technology and are able to work robustly against process variations. The system is suitable in contactless testing or built-in self-test for nano-scale CMOS technology with power consumption less than 1 mW and data-rate of 10 Mbps at 3 GHz carrier. 2013-09-24T07:37:37Z 2019-12-06T20:09:17Z 2013-09-24T07:37:37Z 2019-12-06T20:09:17Z 2012 2012 Journal Article Yu, X. P., Lu, Z. H., Lim, W. M., Liu, Y., & Hu, C. H. (2012). Circuits Design for Contactless Testing of Nano-Scale CMOS Devices and Circuits. Nanoscience and Nanotechnology Letters, 4(9), 930-935(6). https://hdl.handle.net/10356/99587 http://hdl.handle.net/10220/13663 10.1166/nnl.2012.1421 en Nanoscience and nanotechnology letters |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering Yu, Xiao Peng Lu, Zhenghao Lim, Wei Meng Liu, Yang Hu, Chang Hui Circuits design for contactless testing of nano-scale CMOS devices and circuits |
| title | Circuits design for contactless testing of nano-scale CMOS devices and circuits |
| title_full | Circuits design for contactless testing of nano-scale CMOS devices and circuits |
| title_fullStr | Circuits design for contactless testing of nano-scale CMOS devices and circuits |
| title_full_unstemmed | Circuits design for contactless testing of nano-scale CMOS devices and circuits |
| title_short | Circuits design for contactless testing of nano-scale CMOS devices and circuits |
| title_sort | circuits design for contactless testing of nano scale cmos devices and circuits |
| topic | DRNTU::Engineering::Electrical and electronic engineering |
| url | https://hdl.handle.net/10356/99587 http://hdl.handle.net/10220/13663 |
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