| Summary: | The absence of extraction method of the dielectric constant that is more
efficient underlies the calculation of the dielectric constant C-face multilayer
epitaxial graphene from the measurement result of spectroscopic ellipsometry
using Gauss-Newton inversion method. The purpose of this study is to calculate
numerically and interpret the refractive index, dielectric constant, and optical
conductivity of C-face multilayer epitaxial graphene. Extraction of dielectric
constant performed through the data inversion of psi (� ) and delta (�) from
spectroscopic ellipsometry measurement with the incident angle of 70o. In this
study, an analysis to determine the excitonic lifetime was done by
phenomenological Fano model.
Equations that are used in extracting the dielectric constant of C-face
multilayer epitaxial graphene involve Fresnel and Snell's equations. The results
showed three important things: 1) the method of Gauss-Newton numerical
inversion can be used to extract the dielectric constant of C-face multilayer
epitaxial graphene, 2) asymmetric absorption peak at 4,56 eV in terms of the
imaginary part of the dielectric constant and refractive index, and 3) there is an
asymmetric exitonic resonance peak at 4,56 eV of optical conductivity due to
interplay electron-electron and electron-hole.
|
|---|