PERHITUNGAN KONSTANTA DIELEKTRIK FILM TIPIS GRAPHENE EPITAXIAL MULTILAYER C-FACE HASIL PENGUKURAN SPECTROSCOPIC ELLIPSOMETRY DENGAN METODE INVERSI NUMERIK GAUSS-NEWTON
The absence of extraction method of the dielectric constant that is more efficient underlies the calculation of the dielectric constant C-face multilayer epitaxial graphene from the measurement result of spectroscopic ellipsometry using Gauss-Newton inversion method. The purpose of this study is to...
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| Format: | Thesis |
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[Yogyakarta] : Universitas Gadjah Mada
2014
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