Indium Tin Oxide Surface Properties Study by Means of XPS
By using X-ray photoelectron spectroscopy, the surface reaction of indium tin oxide (ITO) with stearic acid and aniline has been studied. Steari acid and aniline are known to have acidic and basic behavior. Weak adsorption of the aniline was observed, indicating that ITO surface has acidic propertie...
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| Format: | Article |
| Language: | English |
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2011
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| Online Access: | https://repository.ugm.ac.id/135066/1/ITOBagas.pdf |
| _version_ | 1797036331813044224 |
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| author | PUJILAKSONO, Bagas |
| author_facet | PUJILAKSONO, Bagas |
| author_sort | PUJILAKSONO, Bagas |
| collection | UGM |
| description | By using X-ray photoelectron spectroscopy, the surface reaction of indium tin oxide (ITO) with stearic acid and aniline has been studied. Steari acid and aniline are known to have acidic and basic behavior. Weak adsorption of the aniline was observed, indicating that ITO surface has acidic properties. Surface properties of ITO have also been studied after depositing an organic Alq3 layer and analyzing the formed interface. As revealed by depth profiling, indium ions are diffusing into Alq3 layer. Peak shape and position of oxygen and indium were changing during argon ion sputtering and indium-oxygen compound has formed at the interface.
Keywords'. Indium tin oxide, XPS, surface properties, interface reaction |
| first_indexed | 2024-03-13T23:44:11Z |
| format | Article |
| id | oai:generic.eprints.org:135066 |
| institution | Universiti Gadjah Mada |
| language | English |
| last_indexed | 2024-03-13T23:44:11Z |
| publishDate | 2011 |
| record_format | dspace |
| spelling | oai:generic.eprints.org:1350662015-08-03T03:45:02Z https://repository.ugm.ac.id/135066/ Indium Tin Oxide Surface Properties Study by Means of XPS PUJILAKSONO, Bagas Nuclear Engineering By using X-ray photoelectron spectroscopy, the surface reaction of indium tin oxide (ITO) with stearic acid and aniline has been studied. Steari acid and aniline are known to have acidic and basic behavior. Weak adsorption of the aniline was observed, indicating that ITO surface has acidic properties. Surface properties of ITO have also been studied after depositing an organic Alq3 layer and analyzing the formed interface. As revealed by depth profiling, indium ions are diffusing into Alq3 layer. Peak shape and position of oxygen and indium were changing during argon ion sputtering and indium-oxygen compound has formed at the interface. Keywords'. Indium tin oxide, XPS, surface properties, interface reaction 2011-02-01 Article PeerReviewed application/pdf en https://repository.ugm.ac.id/135066/1/ITOBagas.pdf PUJILAKSONO, Bagas (2011) Indium Tin Oxide Surface Properties Study by Means of XPS. Proceeding Conference on Materials. pp. 105-121. ISSN 978-979-97986-5-7 |
| spellingShingle | Nuclear Engineering PUJILAKSONO, Bagas Indium Tin Oxide Surface Properties Study by Means of XPS |
| title | Indium Tin Oxide Surface Properties Study by Means of XPS |
| title_full | Indium Tin Oxide Surface Properties Study by Means of XPS |
| title_fullStr | Indium Tin Oxide Surface Properties Study by Means of XPS |
| title_full_unstemmed | Indium Tin Oxide Surface Properties Study by Means of XPS |
| title_short | Indium Tin Oxide Surface Properties Study by Means of XPS |
| title_sort | indium tin oxide surface properties study by means of xps |
| topic | Nuclear Engineering |
| url | https://repository.ugm.ac.id/135066/1/ITOBagas.pdf |
| work_keys_str_mv | AT pujilaksonobagas indiumtinoxidesurfacepropertiesstudybymeansofxps |