Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate
Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi...
| Main Authors: | , , , , |
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| Format: | Proceeding Paper |
| Language: | English |
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2006
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/9439/1/Poly_Si_-_IEEE_2006.pdf |
| _version_ | 1825645106752913408 |
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| author | Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H. |
| author_facet | Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H. |
| author_sort | Muhida, Riza |
| collection | IIUM |
| description | Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi level of the poly-Si layer on the slightly textured substrates is found to locate at the
center of the band gap and this material is 'truly' intrinsic. As RMS roughness of the textured substrate, q increases, the Fermi level becomes close to conduction band edge, and finally, the poly-Si layer on the highly textured
substrate exhibits n-type character even though any deposition conditions for the poly-Si layers are not changed at all. Changes in electrical conductivities of the poly-Si thin films in conjunction with the results on photovoltaic performances and microstructure are also discussed. |
| first_indexed | 2024-03-05T22:42:44Z |
| format | Proceeding Paper |
| id | oai:generic.eprints.org:9439 |
| institution | International Islamic University Malaysia |
| language | English |
| last_indexed | 2024-03-05T22:42:44Z |
| publishDate | 2006 |
| record_format | dspace |
| spelling | oai:generic.eprints.org:94392012-04-04T04:19:32Z http://irep.iium.edu.my/9439/ Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H. TK452 Electric apparatus and materials. Electric circuits. Electric networks Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi level of the poly-Si layer on the slightly textured substrates is found to locate at the center of the band gap and this material is 'truly' intrinsic. As RMS roughness of the textured substrate, q increases, the Fermi level becomes close to conduction band edge, and finally, the poly-Si layer on the highly textured substrate exhibits n-type character even though any deposition conditions for the poly-Si layers are not changed at all. Changes in electrical conductivities of the poly-Si thin films in conjunction with the results on photovoltaic performances and microstructure are also discussed. 2006 Proceeding Paper PeerReviewed application/pdf en http://irep.iium.edu.my/9439/1/Poly_Si_-_IEEE_2006.pdf Muhida, Riza and Sutjipto, Agus Geter Edy and Matsui, T. and Toyama, T. and Okamoto, H. (2006) Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate. In: 8th International Conference on Properties and Applications of Dielectric Materials, 26 - 30 June 2006, Bali, Indonesia. |
| spellingShingle | TK452 Electric apparatus and materials. Electric circuits. Electric networks Muhida, Riza Sutjipto, Agus Geter Edy Matsui, T. Toyama, T. Okamoto, H. Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate |
| title | Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate |
| title_full | Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate |
| title_fullStr | Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate |
| title_full_unstemmed | Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate |
| title_short | Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate |
| title_sort | measuring the electronic properties of poly si thin film solar cells deposited on textured substrate |
| topic | TK452 Electric apparatus and materials. Electric circuits. Electric networks |
| url | http://irep.iium.edu.my/9439/1/Poly_Si_-_IEEE_2006.pdf |
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