The optical properties of oxide films on copper and copper alloys

Suitable conditions were selected to allow thin, thermal oxide films consisting of cuprous oxide only to be grown on copper and dilute copper alloy substrates. The identity of the oxide was confirmed by x-ray diffraction and coulometry. Spectral measurements covering the wavelength range 350 - 750 n...

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Bibliographic Details
Main Author: Hamilton, M. A.
Format: Thesis
Language:English
Published: 1985
Subjects:
Online Access:https://repository.londonmet.ac.uk/3378/1/305359.pdf

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