Microscopy of Metal Oxide Surfaces.
Elevated temperature scanning tunneling microscopy is used to study oxides that are room temperature insulators but become sufficiently electrically conducting at higher temperatures to allow imaging to be performed. Atomic resolution images of NiO, CoO, and UO(2) have been obtained in this fashion...
| Main Authors: | , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2000
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| _version_ | 1797050250018422784 |
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| author | Castell, M Dudarev, S Muggelberg, C Sutton, A Briggs, G Goddard, D |
| author_facet | Castell, M Dudarev, S Muggelberg, C Sutton, A Briggs, G Goddard, D |
| author_sort | Castell, M |
| collection | OXFORD |
| description | Elevated temperature scanning tunneling microscopy is used to study oxides that are room temperature insulators but become sufficiently electrically conducting at higher temperatures to allow imaging to be performed. Atomic resolution images of NiO, CoO, and UO(2) have been obtained in this fashion which allow surface structure and defect determination. To complement the experiments, modeling of the electronic surface structure reveals which atomic sites give rise to the contrast observed in the images. Low voltage scanning electron microscopy is used to image small equilibrium pores in UO(2) single crystals to evaluate the surface energy ratio of the (111) to (001) surfaces. |
| first_indexed | 2024-03-06T18:02:23Z |
| format | Journal article |
| id | oxford-uuid:003ec69b-63a1-4913-8217-9854539061e6 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-06T18:02:23Z |
| publishDate | 2000 |
| record_format | dspace |
| spelling | oxford-uuid:003ec69b-63a1-4913-8217-9854539061e62022-03-26T08:28:27ZMicroscopy of Metal Oxide Surfaces.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:003ec69b-63a1-4913-8217-9854539061e6EnglishSymplectic Elements at Oxford2000Castell, MDudarev, SMuggelberg, CSutton, ABriggs, GGoddard, DElevated temperature scanning tunneling microscopy is used to study oxides that are room temperature insulators but become sufficiently electrically conducting at higher temperatures to allow imaging to be performed. Atomic resolution images of NiO, CoO, and UO(2) have been obtained in this fashion which allow surface structure and defect determination. To complement the experiments, modeling of the electronic surface structure reveals which atomic sites give rise to the contrast observed in the images. Low voltage scanning electron microscopy is used to image small equilibrium pores in UO(2) single crystals to evaluate the surface energy ratio of the (111) to (001) surfaces. |
| spellingShingle | Castell, M Dudarev, S Muggelberg, C Sutton, A Briggs, G Goddard, D Microscopy of Metal Oxide Surfaces. |
| title | Microscopy of Metal Oxide Surfaces. |
| title_full | Microscopy of Metal Oxide Surfaces. |
| title_fullStr | Microscopy of Metal Oxide Surfaces. |
| title_full_unstemmed | Microscopy of Metal Oxide Surfaces. |
| title_short | Microscopy of Metal Oxide Surfaces. |
| title_sort | microscopy of metal oxide surfaces |
| work_keys_str_mv | AT castellm microscopyofmetaloxidesurfaces AT dudarevs microscopyofmetaloxidesurfaces AT muggelbergc microscopyofmetaloxidesurfaces AT suttona microscopyofmetaloxidesurfaces AT briggsg microscopyofmetaloxidesurfaces AT goddardd microscopyofmetaloxidesurfaces |