$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.

Εμφάνιση άλλων εκδόσεων (1)

High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Tong, V, Jiang, J, Wilkinson, A, Britton, T
Μορφή:	Journal article
Γλώσσα:	English
Έκδοση:	Elsevier 2015

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