$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.

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High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross...

書目詳細資料
Main Authors:	Tong, V, Jiang, J, Wilkinson, A, Britton, T
格式:	Journal article
語言:	English
出版:	Elsevier 2015

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