High resolution imaging using the Oxford aberration corrected TEM

Míreanna comhchosúla

• Aberration-corrected HREM/STEM for semiconductor research
  de réir: Hetherington, C, et al.
  Foilsithe / Cruthaithe: (2005)
• Experimental evaluation of a spherical aberration-corrected TEM and STEM.
  de réir: Sawada, H, et al.
  Foilsithe / Cruthaithe: (2005)
• A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
  de réir: Hutchison, J, et al.
  Foilsithe / Cruthaithe: (2005)
• Prospective applications for a double-C-s-corrector TEM/STEM
  de réir: Mobus, G, et al.
  Foilsithe / Cruthaithe: (2001)
• High-resolution TEM and the application of direct and indirect aberration correction.
  de réir: Hetherington, C, et al.
  Foilsithe / Cruthaithe: (2008)