High resolution imaging using the Oxford aberration corrected TEM

Slični predmeti

• Aberration-corrected HREM/STEM for semiconductor research
  od: Hetherington, C, i dr.
  Izdano: (2005)
• Experimental evaluation of a spherical aberration-corrected TEM and STEM.
  od: Sawada, H, i dr.
  Izdano: (2005)
• A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
  od: Hutchison, J, i dr.
  Izdano: (2005)
• Prospective applications for a double-C-s-corrector TEM/STEM
  od: Mobus, G, i dr.
  Izdano: (2001)
• High-resolution TEM and the application of direct and indirect aberration correction.
  od: Hetherington, C, i dr.
  Izdano: (2008)