High resolution imaging using the Oxford aberration corrected TEM
Κύριοι συγγραφείς: | Hetherington, C, Kirkland, A, Doole, R, Cockayne, D, Titchmarsh, J, Hutchison, J |
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Μορφή: | Journal article |
Γλώσσα: | English |
Έκδοση: |
2006
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Παρόμοια τεκμήρια
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Aberration-corrected HREM/STEM for semiconductor research
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Experimental evaluation of a spherical aberration-corrected TEM and STEM.
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A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
ανά: Hutchison, J, κ.ά.
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Prospective applications for a double-C-s-corrector TEM/STEM
ανά: Mobus, G, κ.ά.
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High-resolution TEM and the application of direct and indirect aberration correction.
ανά: Hetherington, C, κ.ά.
Έκδοση: (2008)